Dr. Bybee discusses: the impact of critical illness on pediatric patients and families including Post-Intensive Care Syndrome (PICS-p), chronic critical illness and need for follow up, and how the Helen DeVos Pediatric Critical Care Unit is using innovation to mitigate the effects of PICS-p.
Presented by: Jillian A Bybee MD, FAAP - Director of Quality Improvement and Patient Safety for Pediatric Critical Care Medicine, Assistant Professor of Pediatrics and Human Development at Michigan State University.